Observations of structural defects in web-grown silicon ribbonKIM, Y. K; DE ANGELIS, R. J.Journal of materials science. 1989, Vol 24, Num 2, pp 627-632, issn 0022-2461, 6 p.Article

X-ray diffraction patterns from nanocrystalline binary alloysLEE, J. S; DE ANGELIS, R. J.Nanostructured materials. 1996, Vol 7, Num 7, pp 805-812, issn 0965-9773Article

In situ X-ray diffraction investigation of the structural characteristics of two Co/ZSM-5 catalystsDHERE, A. G; DE ANGELIS, R. J.Journal of catalysis (Print). 1985, Vol 92, Num 1, pp 145-154, issn 0021-9517Article

Diffraction studies on Ni-Co and Ni-Cr alloy thin filmsSETHURAMAN, A. R; DE ANGELIS, R. J; REUCROFT, P. J et al.Journal of materials research. 1991, Vol 6, Num 4, pp 749-754, issn 0884-2914, 6 p.Article

Processing-texture relationship in dual-unbalanced magnetron deposition of TiN filmsROHDE, S. L; KIM, Y. K; DE ANGELIS, R. J et al.Journal of electronic materials. 1993, Vol 22, Num 11, pp 1327-1330, issn 0361-5235Article

Characterization of aluminum films on a polycarbonate substrateDE ANGELIS, R. J; JACOB, R. J; FUNK, J. E et al.Thin solid films. 1991, Vol 202, Num 1, pp 91-96, issn 0040-6090, 6 p.Article

The constitutive equation for silicon and its use in crystal growth modelingTSAI, C. T; DILLON, O. W; DE ANGELIS, R. J et al.Journal of engineering materials and technology. 1990, Vol 112, Num 2, pp 183-187, issn 0094-4289, 5 p.Conference Paper

Through-thickness characterization of copper electrodepositDE ANGELIS, R. J; KNORR, D. B; MERCHANT, H. D et al.Journal of electronic materials. 1995, Vol 24, Num 8, pp 927-933, issn 0361-5235Conference Paper

Starting materials and superconductor stoichiometryHAMRIN, C. E. JR; ARNETT, W. D; DE ANGELIS, R. J et al.Solid state communications. 1989, Vol 69, Num 11, pp 1063-1066, issn 0038-1098Article

Electron microdiffraction studies of zirconia particlesSRINIVASAN, R; DAVIS, B. H; Journal of materials science. 1992, Vol 27, Num 3, pp 661-670, issn 0022-2461Article

Dislocation dynamics and the viscoplastic buckling of dendritic web type silicon ribbonTSAI, C. T; DILLON, O. W. JR; DE ANGELIS, R. J et al.Journal of crystal growth. 1987, Vol 82, Num 4, pp 695-708, issn 0022-0248Article

Dislocation motioń and multiplicatioń during the growth of silicon ribbonKIM, Y. K; DE ANGELIS, R. J; TSAI, C. T et al.Acta metallurgica. 1987, Vol 35, Num 8, pp 2091-2099, issn 0001-6160Article

Dislocation dynamics during the growth of silicon ribbonDILLON, O. W. JR; TSAI, C. T; DE ANGELIS, R. J et al.Journal of applied physics. 1986, Vol 60, Num 5, pp 1784-1792, issn 0021-8979Article

Effect of extended recovery on the recrystallization characteristics of flash-annealed strip cast 3004 aluminum alloyES-SAID, O. S; MORRIS, J. G; DE ANGELIS, R. J et al.Materials characterization. 1993, Vol 30, Num 2, pp 113-125, issn 1044-5803Article

Structural characterization of cobalt catalysts on a silica supportSRINIVASAN, R; DE ANGELIS, R. J; REUCROFT, P. J et al.Journal of catalysis (Print). 1989, Vol 116, Num 1, pp 144-163, issn 0021-9517Article